Name
Title | ||
|---|---|---|
Investigation of the effects of constant voltage stress on thin SiO2 layers using dynamic measurement protocols. |
Year | Venue | DocType |
|---|---|---|
2012 | Microelectronics Reliability | Journal |
Volume | Issue | Citations |
52 | 9-10 | 0 |
PageRank | References | Authors |
0.34 | 1 | 8 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Philippe Chiquet | 1 | 0 | 0.68 |
| Pascal Masson | 2 | 4 | 3.71 |
| Romain Laffont | 3 | 2 | 2.26 |
| G. Micolau | 4 | 19 | 6.42 |
| Jérémy Postel-Pellerin | 5 | 2 | 2.74 |
| Frédéric Lalande | 6 | 0 | 0.68 |
| B. Bouteille | 7 | 1 | 0.96 |
| Jean-Luc Ogier | 8 | 3 | 3.38 |