Name
Abstract | ||
|---|---|---|
Static Linked Faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and makes test algorithm design a very complex task. A large number of March Tests with different fault coverage have been published and some methodologies have been presented to automatically generate March Tests. In this paper we present an approach to automatically generate March Tests for Static Linked Faults. The proposed approach generates better test algorithms then previous, by reducing the test length |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/DATE.2006.244097 | DATE |
Keywords | Field | DocType |
test length,fault effect,better test,automatic march tests generation,large number,interesting class,memory fault,different fault coverage,complex task,static linked faults,automatic test pattern generation,hardware,fault detection,integrated circuit design,semiconductor memory,fault coverage,algorithm design and analysis,computational modeling,logic design,sram,algorithm design | Logic synthesis,Automatic test pattern generation,Semiconductor memory,Fault coverage,Memory faults,Computer science,Fault detection and isolation,Parallel computing,Static random-access memory,Real-time computing,Integrated circuit design | Conference |
ISSN | ISBN | Citations |
1530-1591 | 3-9810801-0-6 | 3 |
PageRank | References | Authors |
0.41 | 15 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| A. Benso | 1 | 148 | 12.69 |
| A. Bosio | 2 | 113 | 15.51 |
| S. Di Carlo | 3 | 128 | 9.63 |
| G. Di Natale | 4 | 111 | 8.87 |
| P. Prinetto | 5 | 516 | 55.23 |