Title
Measurement of the Switching Activity of CMOS Digital Circuits at the Gate Level
Abstract
Accurate estimation of switching activity is very important in digital circuits. In this paper we present a comparison between the evaluation of the switching activity calculated using logic (Verilog) and electrical (HSPICE) simulators. We also study how the variation on the delay model (min, typ, max) and parasitic effects affect the number of transitions in the circuit. Results show a variable and significant overestimation of this measurement using logic simulators even when including postlayout effects. Furthermore, we show the contribution of glitches to the overall switching activity, giving that the treatment of glitches in conventional logic simulators is the main cause of switching activity overestimation.
Year
DOI
Venue
2002
10.1007/3-540-45716-X_35
PATMOS
Keywords
Field
DocType
significant overestimation,main cause,postlayout effect,overall switching activity,cmos digital circuits,digital circuit,gate level,conventional logic simulator,activity overestimation,delay model,switching activity,accurate estimation,parasitic effect,digital circuits
Glitch,Digital electronics,Spice,Computer science,CMOS,Electronic engineering,Logic simulation,Estimation theory,Verilog,Integrated circuit
Conference
ISBN
Citations 
PageRank 
3-540-44143-3
4
0.48
References 
Authors
6
6
Name
Order
Citations
PageRank
C. Baena140.48
Jorge Juan-chico2316.52
Manuel J. Bellido38211.82
P. Ruiz-de-Clavijo451.19
C. J. Jiménez5305.48
Manuel Valencia6286.24