Name
Abstract | ||
|---|---|---|
Integrated on-chip coplanar waveguides (CPWs) can be used as integrated dielectric sensors for chemical and physical material analyses. The experimentally estimated dielectric properties can vary depending on the measurement technique; physical characteristics, such as the dimensions of the transmission line; and the length of the test material. A critical component in the design of these systems ... |
Year | DOI | Venue |
|---|---|---|
2013 | 10.1109/TIM.2012.2218672 | IEEE Transactions on Instrumentation and Measurement |
Keywords | Field | DocType |
Permittivity,Materials,Coplanar waveguides,Transmission line measurements,Permittivity measurement,Dielectrics | Permittivity,Transmission line,Dielectric,Waveguide,Chip,Electronic engineering,Critical parameter,Relative permittivity,Coplanar waveguide,Mathematics | Journal |
Volume | Issue | ISSN |
62 | 3 | 0018-9456 |
Citations | PageRank | References |
0 | 0.34 | 1 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Chathurika D. Abeyrathne | 1 | 0 | 0.68 |
| Malka N. Halgamuge | 2 | 23 | 6.12 |
| Peter M. Farrell | 3 | 10 | 1.98 |
| Efstratios Skafidas | 4 | 200 | 32.11 |