Name
Abstract | ||
|---|---|---|
In the flip-chip ball grid array (FCBGA) assembly process, no-flow underfill has the advantage over traditional capillary-flow underfill on shorter cycle time. Reliability tests are performed on both unmolded and molded FCBGA with three different types of no-flow underfill materials. The JEDEC Level-3 (JL3) moisture preconditioning, followed by reflow and pressure cooker test (PCT) is found to be a critical test for failures of underbump metallization (UBM) opening and underfill/die delamination. In this paper, various types of modeling techniques are applied to analyze the FCBGA-8×8 mm on moisture distribution, hygroswelling behavior, and thermomechanical stress. For moisture diffusion modeling, thermal-moisture analogy is used to calculate the degree of moisture saturation in the multi-material system of FCBGA. The local moisture concentration along the critical interface, e.g. die/underfill, is critical for delamination, because the moisture weakens the interfacial adhesion strength, generates internal vapor pressure during reflow, and induces tensile hygroswelling stress on UBM during PCT. The results of moisture distribution can be used as loading input for the subsequent hygroswelling modeling. The magnitude of hygroswelling stress acting on UBM is found to be greater than the thermal stress induced during reflow, both in tensile mode which may cause the UBM-opening failure. Underfill with lower saturated moisture concentration (Csat) and coefficient of moisture expansion (CME) are found to induce lower UBM stress and has better reliability results. Molded package generally has higher stress level than unmolded package. Parametric studies are performed to study the effects of no-flow underfill materials, package type (molded vs. unmolded), die thickness, and substrate size on the stresses of UBM during reflow and PCT. |
Year | DOI | Venue |
|---|---|---|
2003 | 10.1016/S0026-2714(03)00035-0 | Microelectronics Reliability |
Keywords | Field | DocType |
thermal stress,flip chip,diffusion model,ball grid array,vapor pressure,cycle time | Ball grid array,Flip chip,Moisture,Composite material,Flow (psychology),Stress (mechanics),Ultimate tensile strength,Engineering,Moisture diffusion,Reliability engineering,Forensic engineering,Delamination | Journal |
Volume | Issue | ISSN |
43 | 5 | 0026-2714 |
Citations | PageRank | References |
3 | 1.23 | 0 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Tong Yan Tee | 1 | 84 | 27.45 |
| Chek Lim Kho | 2 | 3 | 1.23 |
| Daniel Yap | 3 | 21 | 12.38 |
| Carol Toh | 4 | 3 | 1.23 |
| Xavier Baraton | 5 | 16 | 10.91 |
| Zhao-Wei Zhong | 6 | 212 | 36.01 |