Name
Abstract | ||
|---|---|---|
This work presents the application of advanced analysis processes and datamining to imagesproduced by scanning probe microscopy in polymers samplers. These techniques are applied to two specific problems: statistical characterization of polydispersivity in films of poly (o-methoxyaniline) (POMA) and morphological analysis of substrates of polymers used to produce liquid crystals alignment. |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1109/SIBGRAPI.2001.963099 | SIBGRAPI |
Keywords | Field | DocType |
advanced image characterization,statistical characterization,probe microscopy,liquid crystals alignment,advanced analysis process,scanning probe microscopy,morphological analysis,specific problem,polymers sampler,application software,image processing,liquid crystal,polymers,liquid crystals,image analysis,data mining | Polymer,Scanning capacitance microscopy,Image processing,Scanning probe microscopy,Polymer characterization,Scanning ion-conductance microscopy,Vibrational analysis with scanning probe microscopy,Optoelectronics,Liquid crystal,Materials science | Conference |
ISBN | Citations | PageRank |
0-7695-1330-1 | 0 | 0.34 |
References | Authors | |
0 | 9 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| C. A. Rodrigues | 1 | 0 | 0.34 |
| S. C. D. Pinto | 2 | 0 | 0.34 |
| Luciano da Fontoura Costa | 3 | 542 | 63.09 |
| R. M. Faria | 4 | 0 | 0.34 |
| N. C. de Souza | 5 | 0 | 0.34 |
| Osvaldo N. Oliveira Jr. | 6 | 247 | 17.25 |
| I. H. Bechtold | 7 | 0 | 0.34 |
| E. A. Oliveira | 8 | 0 | 0.34 |
| J. J. Bonvent | 9 | 0 | 0.34 |