Name
Abstract | ||
|---|---|---|
A system for statistical circuit analysis, yield estimation and design centering is presented. The system architecture is based on the decomposition of the simulation process into three logically independent layers. A dedicated language is a significant part of the system. Its syntax implements an advanced technique that allows one to create flexible circuit performance extraction procedures. An application example demonstrates the system capabilities. |
Year | DOI | Venue |
|---|---|---|
1995 | 10.1109/EDTC.1995.470348 | EDTC '95 Proceedings of the 1995 European conference on Design and Test |
Keywords | Field | DocType |
analogue integrated circuits,integrated circuit yield,software development,statistical analysis,yield estimation,statistical circuit analysis,statistical simulation,analogue circuit,independent layer,system capability,circuit analysis computing,design centering,dedicated language,flexible circuit performance extraction,simulation process,system architecture,advanced technique,analogue circuits,circuit performance extraction procedures,software engineering,significant part,application example,data mining,programming,manufacturing,production,integrated circuit | Analogue circuits,Statistical simulation,Computer science,Electronic engineering,Network analysis,Systems architecture,Circuit performance,Syntax,Computer engineering,Software development,Statistical analysis | Conference |
ISBN | Citations | PageRank |
0-8186-7039-8 | 0 | 0.34 |
References | Authors | |
3 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Driouk, E. | 1 | 0 | 0.34 |
| Jarov, O. | 2 | 0 | 0.34 |
| Sukhodolsky, A. | 3 | 0 | 0.34 |