Abstract | ||
---|---|---|
The inhomogeneous charge distribution in several plate capacitors is calculated using the Method of Moments. Effects of global and local “inhomogeneities” in the capacitor are simulated. |
Year | DOI | Venue |
---|---|---|
2004 | 10.1016/j.compeleceng.2002.10.002 | Computers & Electrical Engineering |
Keywords | Field | DocType |
charge distribution | Statistical physics,Capacitor,Computer science,Real-time computing,Electronic engineering,Charge density,Method of moments (statistics) | Journal |
Volume | Issue | ISSN |
30 | 3 | 0045-7906 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
2 |
Name | Order | Citations | PageRank |
---|---|---|---|
Er-Wei Bai | 1 | 750 | 90.65 |
Karl E. Lonngren | 2 | 3 | 1.61 |