Name
Abstract | ||
|---|---|---|
In this paper, we propose a diagnostic test generation method in conjunction with an efficient sequential SAT-based diagnosis procedure to precisely identify multiple defective signals which can jointly explain the circuit驴s faulty behavior. This method can be applied after any existing state-of-the-art diagnosis process to further improve the diagnosis resolution. The proposed diagnosis method generates limited-cycle sequential tests for SAT-based diagnosis which results in significantly higher diagnosis accuracy for multiple faults. The experimental results demonstrate the effectiveness of the proposed method. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1109/ICCD.2005.18 | ICCD |
Keywords | Field | DocType |
multiple defective signal,higher diagnosis accuracy,existing state-of-the-art diagnosis process,diagnosis resolution,efficient sequential sat-based diagnosis,diagnostic test generation method,proposed diagnosis method,limited-cycle sequential test,multiple faults,sat-based diagnosis,accurate diagnosis,limit cycle,boolean functions,automatic test pattern generation,diagnostic test,computability | Stuck-at fault,Boolean function,Automatic test pattern generation,Fault coverage,Logic testing,Computer science,Diagnostic test,Algorithm,Computability | Conference |
ISSN | ISBN | Citations |
1063-6404 | 0-7695-2451-6 | 1 |
PageRank | References | Authors |
0.36 | 12 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yung-Chieh Lin | 1 | 167 | 10.50 |
| Feng Lu | 2 | 174 | 12.25 |
| Kwang-Ting Cheng | 3 | 5755 | 513.90 |