Name
Abstract | ||
|---|---|---|
The analysis of Electronic Speckle Pattern Interferometer (ESPI) images is presented. These images consist of a random speckle field modulated by an interference fringe pattern. In this particular application the fringe pattern is produced by the shrinkage of a swollen polymer film coating the test specimen. This shrinkage is produced by the evaporation of the swelling agent when the specimen is exposed to a test airflow. The position and spacing of the fringes measures the differential thickness of the polymer film from which the shrinkage and corresponding mass transfer coefficients can be calculated. These mass transfer coefficients can then be converted into heat transfer coefficients. The aim of the analysis is to automatically describe the fringe pattern so that the spatial distribution of the mass transfer coefficients can be deduced. The analysis consists of identifying image pixels as minima of the fringe pattern. A novel approach is used to solve both the special problems of processing speckle images and the analysis of fringes unconstrained in orientation. |
Year | DOI | Venue |
|---|---|---|
1987 | 10.1016/0167-8655(87)90047-X | Pattern Recognition Letters |
Keywords | Field | DocType |
fringe minimum,image processing,electronic speckle pattern image,interference fringes,speckle images | Electronic speckle pattern interferometry,Computer vision,Shrinkage,Speckle pattern,Image processing,Interferometry,Maxima and minima,Speckle imaging,Artificial intelligence,Speckle noise,Mathematics | Journal |
Volume | Issue | ISSN |
6 | 1 | Pattern Recognition Letters |
Citations | PageRank | References |
0 | 0.34 | 2 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| K. Paler | 1 | 28 | 9.80 |
| k m crennell | 2 | 0 | 0.34 |
| J. Kittler | 3 | 14346 | 1465.03 |
| b n dobbins | 4 | 0 | 0.34 |
| b l button | 5 | 0 | 0.34 |
| C. Wykes | 6 | 5 | 1.48 |