Title
Optimising variability tolerant standard cell libraries
Abstract
This paper describes an approach to optimise transistor dimensions within a standard cell library. The goal is to extract high-speed and low-power circuits which are more tolerant to the random fluctuations that will be prevalent in future technology nodes. Using statistically enhanced SPICE models based on 3D-atomistic simulations, a genetic algorithm optimises the device widths within a circuit using a multi-objective fitness function. The results show the impact of threshold voltage variation can be reduced by optimising transistor widths, and suggest a similar method could be extended to the optimisation of larger circuits.
Year
DOI
Venue
2009
10.1109/CEC.2009.4983223
IEEE Congress on Evolutionary Computation
Keywords
Field
DocType
random fluctuation,future technology node,variability tolerant standard cell,genetic algorithm,transistor width,multiobjective fitness function,transistor dimension,larger circuit,device width,low-power circuit,spice model,network topology,threshold voltage,data mining,genetic algorithms,design optimization,logic gates,low power electronics,transistors,fitness function,fluctuations,circuit topology,electronics industry
Mathematical optimization,Computer science,Spice,Fitness function,Electronic engineering,Standard cell,Transistor,Electronic circuit,Threshold voltage,Low-power electronics,Topology (electrical circuits)
Conference
ISBN
Citations 
PageRank 
978-1-4244-2959-2
7
0.62
References 
Authors
8
3
Name
Order
Citations
PageRank
James A. Hilder1596.98
James Alfred Walker225022.94
Andy M. Tyrrell362973.61