Name
Title | ||
|---|---|---|
Massive statistical process variations: A grand challenge for testing nanoelectronic circuits |
Abstract | ||
|---|---|---|
Increasing parameter variations, high defect densities and a growing susceptibility to external noise in nanoscale technologies have led to a paradigm shift in design. Classical design strategies based on worst-case or average assumptions have been replaced by statistical design, and new robust and variation tolerant architectures have been developed. At the same time testing has become extremely challenging, as parameter variations may lead to an unacceptable behavior or change the impact of defects. Furthermore, for robust designs a precise quality assessment is required particularly showing the remaining robustness in the presence of manufacturing defects. The paper pinpoints the key challenges for testing nanoelectronic circuits in more detail, covering the range of variation-aware fault modeling via methods for statistical testing and their algorithmic foundations to robustness analysis and quality binning. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1109/DSNW.2010.5542612 | DSN Workshops |
Keywords | Field | DocType |
parameter variation,statiscal testing,integrated circuit testing,external noise,nanoscale technologies,integrated circuit manufacture,remaining robustness,quality assessment,manufacturing defects,robustness analysis,nanoelectronic circuit,time testing,precise quality assessment,massive statistical process variation,robust design,classical design strategy,quality management,nanoelectronic circuits testing,massive statistical process variations,nanoelectronics,statistical design,quality binning,grand challenge,process variation,fault model,paradigm shift,automatic test pattern generation,robustness,fault tolerance,statistical test | Automatic test pattern generation,Nanoelectronics,Paradigm shift,Computer science,Robustness (computer science),Fault tolerance,Statistical process control,Nanoelectronic circuits,Quality management,Reliability engineering | Conference |
ISBN | Citations | PageRank |
978-1-4244-7728-9 | 7 | 0.49 |
References | Authors | |
21 | 6 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| B. Becker | 1 | 191 | 21.44 |
| S. Hellebrand | 2 | 107 | 12.02 |
| Ilia Polian | 3 | 889 | 78.66 |
| B. Straube | 4 | 7 | 0.49 |
| W. Vermeiren | 5 | 7 | 0.49 |
| H.-J. Wunderlich | 6 | 62 | 6.60 |