Title
A 1.8-V embedded 18-Mb DRAM macro with a 9-ns RAS access time and memory-cell area efficiency of 33%
Abstract
A 1.8-V embedded 18-Mb DRAM macro with a 9-ns row-address-strobe access time and memory-cell area efficiency of 33% has been successfully developed with a single-side interface architecture, high-speed circuit design, and low-voltage design. In the high-speed circuit design, a multiword redundancy scheme and Y-select merged sense scheme are developed to achieve the performance goal. In the low-vol...
Year
DOI
Venue
2001
10.1109/4.910489
IEEE Journal of Solid-State Circuits
Keywords
DocType
Volume
Random access memory,Capacitors,Circuit synthesis,Latches,Charge pumps,Low voltage,High speed integrated circuits,Integrated circuit noise,Voltage control,Bandwidth
Journal
36
Issue
ISSN
Citations 
3
0018-9200
0
PageRank 
References 
Authors
0.34
1
17
Name
Order
Citations
PageRank
Y. Yokoyama100.68
N. Itoh201.01
M. Hasegawa300.34
M. Katayama400.68
H. Akasaki500.34
M. Kaneda600.34
T. Ueda700.34
Y. Tanaka831.77
E. Yamasaki900.34
M. Todokoro1000.34
K. Toriyama1100.34
H. Miki1200.34
M. Yagyu1300.34
K. Takashima1400.34
T. Kobayashi15396.78
S. Miyaoka1600.34
N. Tamba1700.34