Title
Built-In Self-Test for Embedded Voltage Regulator
Abstract
The embedded voltage regulator design supports the single-chip CMOS integration market strategy to reduce the overall system cost and improve system performance. Multiply technologies, such as innovative built-in self-test technology and accurate test methodology for embedded voltage regulator are presented that is critical for test accessibility and reliability.
Year
DOI
Venue
2008
10.1109/DELTA.2008.41
DELTA
Keywords
Field
DocType
embedded,cmos integrated circuits,self-test,embedded voltage regulator,voltage output,single-chip cmos integration market strategy,voltage regulators,built-in self test,built-in self-test,manufacturing,reliability,built-in,regulator,current loading,voltage regulator,chip,system performance,marketing strategy
Test method,Regulator,Computer science,Electronic engineering,CMOS,Self test,Electrical engineering,Market strategy,Voltage regulator,Built-in self-test
Conference
ISBN
Citations 
PageRank 
978-0-7695-3110-6
0
0.34
References 
Authors
0
2
Name
Order
Citations
PageRank
Jiang Shi100.34
Ricky Smith200.68