Paper Info
Title
Error Resilient Estimation and Adaptive Binary Selection for Fast and Reliable Identification of RFID Tags in Error-Prone Channel
Abstract
In RFID systems, far field passive tags send information using back scattering. The signal level is typically very small, so channel error during transmission may occur frequently. Due to channel error, performance of RFID tag identification under error-prone channel is degraded compared to that under error-free channel. In this paper, we propose a novel error resilient estimation and adaptive binary selection to overcome the problem of channel errors. Our proposed error resilient estimation algorithm can estimate the number of tags and the channel state accurately regardless of frame errors. And our proposed adaptive binary selection reduces the idle slots caused by frame errors. Performance analysis and simulation results show that the proposed algorithm consumes up to 20 percent less time slots than the binary tree protocol and dynamic framed slotted ALOHA (DFSA) in various packet error rate (PER) conditions.
Year
DOI
Venue
2012
10.1109/TMC.2011.112
IEEE Trans. Mob. Comput.
Keywords
Field
DocType
error-prone channel,proposed error,channel state,channel error,binary tree protocol,adaptive binary selection,novel error resilient estimation,error resilient estimation,error-free channel,rfid tags,frame error,various packet error rate,reliable identification,radio frequency identification,radiation detector,algorithm design,rfid,binary trees,binary tree,packet error rate,radiofrequency,rfid tag,radiation detectors,protocols,algorithm design and analysis,estimation
Algorithm design,Aloha,Signal level,Computer science,Computer network,Binary tree,Communication channel,Radio-frequency identification,Binary number,Bit error rate
Journal
Volume
Issue
ISSN
11
6
1536-1233
Citations 
PageRank 
References 
2
0.41
10
Authors
2
Name
Order
Citations
PageRank
Jongho Park113016.29
Tae-Jin Lee263983.17