Paper Info
Title
Defect Detection Differences between Launch-Off-Shift and Launch-Off-Capture in Sense-Amplifier-Based Flip-Flop Testing
Abstract
About half of the logic circuit transistors of a modern integrated circuit design reside inside the scan flip-flops [1]. Even though prior work analyzed detection of defects in traditional master-slave flip-flop circuits, to the best of our knowledge, this work is the first one regarding detection of defects in a sense-amplifier-based flip-flop, which is a preferred design style in some high-speed low-power designs. In this work, we uncover a class of resistive open and resistive short defects in such a flip-flop design, which show a great difference in their detection response to launch-off-shift versus launch-off-capture due to their sensitivity to clock-gating and data input transitions.
Year
DOI
Venue
2009
10.1109/VTS.2009.39
VTS
Keywords
Field
DocType
traditional master-slave flip-flop circuit,logic circuit transistor,high-speed low-power design,sense-amplifier-based flip-flop testing,defect detection differences,sense-amplifier-based flip-flop,prior work,flip-flop design,resistive short defect,modern integrated circuit design,preferred design style,detection response,switches,integrated circuit design,logic gates,logic circuits,low power electronics,resistance,fault detection,clock gating,master slave,transistors
Sense amplifier,Logic gate,Computer science,Resistive touchscreen,Electronic engineering,Real-time computing,Integrated circuit design,Electronic circuit,Transistor,Flip-flop,Low-power electronics
Conference
ISSN
ISBN
Citations 
1093-0167
978-0-7695-3598-2
0
PageRank 
References 
Authors
0.34
10
1
Name
Order
Citations
PageRank
Haluk Konuk1949.93