Name
Abstract | ||
|---|---|---|
This paper proposes a self-test method of coarse grain dynamically reconfigurable processors (DRPs) without hardware overhead. In the method, processor elements (PEs) compose a test frame, which consists of test pattern generators (TPGs), processor elements under test (PEUTs) and response analyzers (RAs), while testing themselves one another by changing test frames appropriately. We design several test frames with different structures, and discuss the relationship of the structures to the numbers of contexts and test frames for testing all the functions of PEs. A case study shows that there exists an optimal test frame which minimizes the test application time under a constraint. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1093/ietisy/e91-d.3.756 | IEICE Transactions |
Keywords | DocType | Volume |
hardware overhead,test application time,self-test method,different structure,coarse grain dynamically reconfigurable,processor element,test frame,test frames,dynamically reconfigurable processors,case study,optimal test frame,test pattern generator,test methods | Journal | E91-D |
Issue | ISSN | Citations |
3 | 1745-1361 | 4 |
PageRank | References | Authors |
0.48 | 8 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Tomoo Inoue | 1 | 352 | 47.23 |
| Takashi Fujii | 2 | 4 | 0.48 |
| Hideyuki Ichihara | 3 | 96 | 18.92 |