Title
An Arbitrary Digital Power Noise Generator Using 65 Nm Cmos Technology
Abstract
An arbitrary noise generator (ANG) is based on time-series charging of divided parasitic capacitance (TSDPC) and emulates power supply noise generation in a CMOS digital circuit. A prototype ANG incorporates an array of 32 x 32 6-bit TSDPC cells along with a 128-word vector memory and occupies 2 x 2 mm(2) in a 65 nm 1.2 V CMOS technology. Digital noise emulation of functional logic cores such as register arrays is demonstrated with chip-level waveform monitoring at power supply, ground, as well as substrate nodes.
Year
DOI
Venue
2010
10.1587/transele.E93.C.820
IEICE TRANSACTIONS ON ELECTRONICS
Keywords
Field
DocType
noise emulation, substrate noise, power supply noise, signal integrity, substrate coupling, power integrity
Digital electronics,Parasitic capacitance,Signal integrity,Power integrity,Electronic engineering,CMOS,Image noise,Substrate coupling,Engineering,Noise generator,Electrical engineering
Journal
Volume
Issue
ISSN
E93C
6
0916-8524
Citations 
PageRank 
References 
0
0.34
7
Authors
7
Name
Order
Citations
PageRank
Tetsuro Matsuno1264.50
Daisuke Fujimoto2256.52
Daisuke Kosaka3203.98
Naoyuki Hamanishi4148.16
Ken Tanabe510.72
Masazumi Shiochi610.72
Makoto Nagata728576.47