Abstract | ||
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In this paper, we propose a method to reduce the blind spot based on signal processing that indicates the minimum length of a cable under test in the time-frequency domain reflectometry without using an extension cable or adding a new high-speed hardware component. The time-frequency domain reflectometry adopted the proposed method can be achieved with not only a simple modi. cation of the previous system but also a simple technique based on signal processing. The experimental results show that the proposed method allows us to estimate fault distance on the cable with high spatial resolution. |
Year | DOI | Venue |
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2008 | 10.1587/elex.5.265 | IEICE ELECTRONICS EXPRESS |
Keywords | Field | DocType |
time-frequency domain reflectometry, blind spot, spatial resolution, fault detection | Signal processing,Fault detection and isolation,Computer science,Blind spot,Optics,Electronic engineering,Reflectometry,Image resolution,Time frequency domain | Journal |
Volume | Issue | ISSN |
5 | 8 | 1349-2543 |
Citations | PageRank | References |
3 | 0.60 | 2 |
Authors | ||
5 |
Name | Order | Citations | PageRank |
---|---|---|---|
Ki Seok Kwak | 1 | 8 | 2.42 |
Seung Ho Doo | 2 | 5 | 1.08 |
Chun Ku Lee | 3 | 6 | 1.57 |
Jin Bae Park | 4 | 1351 | 102.77 |
Tae Sung Yoon | 5 | 20 | 7.54 |