Name
Abstract | ||
|---|---|---|
The paper describes a reliability prediction methodology that may be used to evaluate the reliability of electronics systems for industrial applications. The proposed methodology takes advantage of the potentiality of different reliability approaches. The aim of this new methodology is to minimize the deficiencies of the traditional reliability prediction methods calculating a corrective factor using the available field return data. In this way is possible to realize more realistic reliability assessment also in the case of new products or products without historic data. Applications of this prediction methodology on real electronic industrial systems are presented. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1016/j.microrel.2005.07.014 | Microelectronics Reliability |
Field | DocType | Volume |
Industrial systems,Electronics,Engineering,Electronic component,Reliability engineering | Journal | 45 |
Issue | ISSN | Citations |
9 | 0026-2714 | 3 |
PageRank | References | Authors |
0.52 | 2 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| G. Cassanelli | 1 | 21 | 3.85 |
| G. Mura | 2 | 39 | 8.68 |
| F. Cesaretti | 3 | 3 | 0.52 |
| M. Vanzi | 4 | 89 | 33.52 |
| F. Fantini | 5 | 33 | 10.12 |