Name
Abstract | ||
|---|---|---|
The accuracy of electron-beam waveform measurements is discussed, and the source of several potential measurement errors is described. The importance of testing for such errors is emphasized. Examples of detectable errors in waveform amplitude, waveform noise, and time resolution, are presented and discussed. Where appropriate, methods of avoiding such errors are described. |
Year | DOI | Venue |
|---|---|---|
1997 | 10.1109/54.632884 | IEEE Design & Test of Computers |
Keywords | Field | DocType |
electron-beam waveform measurement,time resolution,detectable error,waveform noise,preventing measurement errors,waveform amplitude,potential measurement error,vlsi,measurement errors | Electron beam testing,Oscilloscope,Computer science,Electronic engineering,Electrical engineering,Very-large-scale integration,Observational error | Journal |
Volume | Issue | ISSN |
14 | 4 | 0740-7475 |
Citations | PageRank | References |
0 | 0.34 | 1 |
Authors | ||
1 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Keith A. Jenkins | 1 | 56 | 7.98 |