Title
A novel readout IC with high noise immunity for charge-based touch screen panels
Abstract
The critical issues in charge-based touch screen panels for large size display are noise and speed. To solve these, this paper introduces a two-point relative sensing based `Delta-Integration' scheme. It eliminates local noise and increases a readout difference between the touched and non-touched area. As a result, it can replace a high-resolution ADC with a comparator and counter. In addition, the single-bit conversion of Δ-integration method and the proposed wide-bandwidth charge amplifier solve a speed issue of a large display. The prototype chip is implemented in a 0.35-μm CMOS technology.
Year
DOI
Venue
2010
10.1109/CICC.2010.5617378
Custom Integrated Circuits Conference
Keywords
Field
DocType
CMOS integrated circuits,analogue-digital conversion,comparators (circuits),readout electronics,touch sensitive screens,CMOS technology,charge amplifier,charge-based touch screen panels,delta-integration scheme,high-resolution analog-digital converters,noise immunity,readout integrated circuits,size 0.35 mum,two-point relative sensing
Particle detector,Comparator,Computer science,Chip,CMOS,Electronic engineering,Charge amplifier,Pixel,Integrated circuit,Noise immunity,Electrical engineering
Conference
ISSN
ISBN
Citations 
0886-5930
978-1-4244-5758-8
4
PageRank 
References 
Authors
0.84
2
9
Name
Order
Citations
PageRank
Junhyeok Yang1397.60
Seungchul Jung25011.03
Young-Jin Woo3479.63
Jinyong Jeon4349.16
Sungwoo Lee56114.50
Changbyung Park6468.41
Hyun-Sik Kim74013.29
Seung-Tak Ryu829946.61
Gyu-Hyeong Cho940176.39