Paper Info
Title
Combined Self-Test of Analog Portion and ADCs in Integrated Mixed-Signal Circuits
Abstract
Testing is a critical stage in integrated circuits production in order to guarantee reliability. The complexity and high integration level of mixed-signal ICs has put forward new challenges to circuit testing. This paper describes an oscillation-based combined self-test strategy for the analog portion and analog-to-digital converters (ADCs) in integrated mixed-signal circuits. In test mode, the analog portion under test is reconfigured into an oscillator, generating periodic signals as the test stimulus of ADC. By analyzing the A/D conversion results, a histogram test of ADC can be performed, and the oscillation frequency as well as amplitude can be checked, and in this way the oscillation test of the analog portion is realized simultaneously. For an analog benchmark circuit combined with an ADC, triangle oscillation and sinusoid oscillation schemes are both given to test their faults. Experimental results show that fault coverage of the analog portion is 92.2% and 94.3% in the two schemes respectively, and faults in the ADC can also be tested.
Year
DOI
Venue
2008
10.1093/ietisy/e91-d.8.2134
IEICE Transactions
Keywords
Field
DocType
oscillation frequency,sinusoid oscillation scheme,test mode,oscillation test,integrated mixed-signal circuits,combined self-test,analog portion,triangle oscillation,test stimulus,circuit testing,analog benchmark circuit,histogram test,analog,fault coverage,oscillation,oscillations,integrated circuit
Oscillation,Analog device,Fault coverage,Control theory,Computer science,Electronic engineering,Artificial intelligence,Integrated circuit,Computer vision,Analog multiplier,Converters,Mixed-signal integrated circuit,Electronic circuit
Journal
Volume
Issue
ISSN
E91-D
8
1745-1361
Citations 
PageRank 
References 
0
0.34
14
Authors
3
Name
Order
Citations
PageRank
Geng Hu100.34
Hong Wang2113.37
Shiyuan Yang35115.08