Title
Test coverage and post-verification defects: A multiple case study
Abstract
Test coverage is a promising measure of test effectiveness and development organizations are interested in cost-effective levels of coverage that provide sufficient fault removal with contained testing effort. We have conducted a multiple-case study on two dissimilar industrial software projects to investigate if test coverage reflects test effectiveness and to find the relationship between test effort and the level of test coverage. We find that in both projects the increase in test coverage is associated with decrease in field reported problems when adjusted for the number of prerelease changes. A qualitative investigation revealed several potential explanations, including code complexity, developer experience, the type of functionality, and remote development teams. All these factors were related to the level of coverage and quality, with coverage having an effect even after these adjustments. We also find that the test effort increases exponentially with test coverage, but the reduction in field problems increases linearly with test coverage. This suggests that for most projects the optimal levels of coverage are likely to be well short of 100%.
Year
DOI
Venue
2009
10.1109/ESEM.2009.5315981
ESEM
Keywords
Field
DocType
software measurement,organization development,test coverage,data mining,testing,code complexity,software metrics,cost effectiveness,software quality,correlation,software development
Code coverage,Systems engineering,Test effort,Computer science,Cyclomatic complexity,Software,Industrial software,Software metric,Software quality,Reliability engineering,Software measurement
Conference
ISSN
Citations 
PageRank 
1938-6451
37
1.30
References 
Authors
19
3
Name
Order
Citations
PageRank
Audris Mockus14031308.78
Nachiappan Nagappan24602190.30
Trung T. Dinh-trong318711.29