Paper Info
Title
Evm Testing Of Wireless Ofdm Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms
Abstract
In production testing of wireless systems, measurement of EVM (a critical spec that is directly related to bit error rate) incurs significant test time due to the large numbers of symbols that need to be transmitted for reasons of accuracy. In our approach, EVM is modeled as a function of the system static non-idealities (IQ mismatch, gain, IIP3 parameters) and dynamic non-idealities (system noise, VCO phase noise). Using a selected subset of the OFDM tones, the static parameters are calculated first. These are then used to facilitate noise estimation using a back-end constellation compensation and noise amplification procedure. The data generated is used to predict EVM using machine learning methods. Significant reduction in test time is achieved with little loss in test accuracy.
Year
DOI
Venue
2008
10.1109/TEST.2008.4700603
2008 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, PROCEEDINGS
Keywords
Field
DocType
digital signal processing,transceivers,bit error rate,phase noise,ofdm modulation,signal processing,noise,ofdm,radio frequency,gain,wireless communication,machine learning
Signal processing,Wireless,Transceiver,Computer science,Phase noise,Electronic engineering,Voltage-controlled oscillator,Real-time computing,Spec#,Orthogonal frequency-division multiplexing,Bit error rate
Conference
ISSN
Citations 
PageRank 
1089-3539
7
0.63
References 
Authors
8
5
Name
Order
Citations
PageRank
Vishwanath Natarajan112511.96
Hyun Woo Choi2356.71
Deuk Lee3111.74
Rajarajan Senguttuvan4948.66
Abhijit Chatterjee51949269.99