Paper Info
Title
Testability of circuits derived from functional decision diagrams
Abstract
We investigate the testability properties of Boolean networks derived from a special class of multi-level AND/EXOR expressions, called ordered functional decision diagrams (OFDDs). We consider the stuck-at fault model (SAFM) and the cellular fault model (CFM). All occurring redundancies are classified. The resulting circuits are highly testable with nearly 100% fault coverage on average
Year
DOI
Venue
1994
10.1109/EDTC.1994.326922
EDAC-ETC-EUROASIC
Keywords
DocType
Citations 
boolean networks,controllability,multilevel and/exor expressions,redundancy,testability properties,stuck-at fault model,ordered functional decision diagrams,redundancies classification,fault coverage,cellular fault model,boolean functions,combinatorial circuits,logic testing,decision diagram,boolean network,fault model
Conference
2
PageRank 
References 
Authors
0.63
1
2
Name
Order
Citations
PageRank
Bernd Becker134531.68
Rolf Drechsler23707351.36