Name
Abstract | ||
|---|---|---|
Within a wider framework for evaluating reliability of devices and systems for Raman applications, a systematic test plan has been executed on pump/pump and pump/signal WDM filters from many different suppliers. The results point out a variety of performances and different stability, mainly upon environmental stresses. (C) 2002 Elsevier Science Ltd. All rights reserved. |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1016/S0026-2714(02)00142-7 | Microelectronics Reliability |
Field | DocType | Volume |
Wavelength-division multiplexing,Electronic engineering,Engineering,Reliability engineering | Journal | 42 |
Issue | ISSN | Citations |
9 | 0026-2714 | 0 |
PageRank | References | Authors |
0.34 | 0 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| M. Vanzi | 1 | 89 | 33.52 |
| G. Salmini | 2 | 0 | 0.68 |
| R. Pastorelli | 3 | 0 | 0.34 |
| S. Pessina | 4 | 0 | 0.34 |
| P. Furcas | 5 | 0 | 0.68 |