Title
Multiple-Fault Diagnosis Based On Adaptive Diagnostic Test Pattern Generation
Abstract
In this paper, we propose two fault-diagnosis methods for improving multiple-fault diagnosis resolution. The first method, based on the principle of single-fault activation and single-output observation, employs a new circuit transformation technique in conjunction with the use of a special type of diagnostic test pattern, named single-observation single-location-at-a-time (SO-SLAT) pattern. Given a list of candidate suspects (which could be stuck-at, transition, bridging, or other faults obtained by any existing diagnosis method), we generate a set of SO-SLAT patterns, each of which attempts to activate only one fault in the list and propagate its effects only to a specific observation point. Observing the responses of the circuit under diagnosis to the SO-SLAT patterns helps more precisely determine whether each fault suspect is a true or false candidate. The method can tolerate most of the timing hazards for a more accurate diagnosis of failures caused by timing faults. The second method generates and applies limited-cycle sequential tests, based on a Boolean satisfiability solver, to identify multiple defective signals which can jointly explain the circuit's faulty behavior. These two methods can be applied independently and/or jointly after any existing state-of-the-art diagnosis process to further improve the diagnosis resolution. The experimental results demonstrate the effectiveness of the proposed methods for diagnosing multiple faults, including timing faults
Year
DOI
Venue
2007
10.1109/TCAD.2006.884486
IEEE Trans. on CAD of Integrated Circuits and Systems
Keywords
DocType
Volume
new circuit transformation technique,timing fault,integrated circuit testing,diagnosis,very large scale integration (VLSI),very large scale integration,adaptive diagnostic test pattern,existing diagnosis method,testing,existing state-of-the-art diagnosis process,multiple-fault diagnosis resolution,so-slat pattern,fault diagnosis,adaptive diagnostic test,VLSI,accurate diagnosis,Boolean satisfiability,diagnosis resolution,fault-diagnosis method,multiple fault diagnosis,pattern generation,Boolean functions
Journal
26
Issue
ISSN
Citations 
5
0278-0070
22
PageRank 
References 
Authors
0.94
23
3
Name
Order
Citations
PageRank
Yung-Chieh Lin116710.50
Feng Lu217412.25
Kwang-Ting Cheng35755513.90