Title
Rapid thermal plasma deposition of transparent nanocrystalline ZnO thin films and the effects of annealing
Abstract
Conductive, undoped zinc oxide nanocrystalline thin film with predominant c-axis orientation is prepared on crystalline and amorphous substrates using a rapid, one-step ambient-pressure, thermal plasma chemical vapor deposition process. Nonporous and conformal zinc oxide films can be prepared at temperature as low as 160°C, with an average grain size of 25 nm. Scanning electron micrographs indicate a growth rate of 15~50 nm/min, depending on factor including source temperature, deposition temperature, and pressure. X-ray diffraction shows a predominant (002) grain orientation that is independent of the substrate's crystallinity. For films with thickness of 200 nm, the average electrical conductivity ranges from 60-910 S/m. The results demonstrate the potential of thermal plasma CVD for the rapid synthesis of conductive zinc oxide film at ambient condition.
Year
DOI
Venue
2012
10.1109/NEMS.2012.6196770
NEMS
Keywords
Field
DocType
conductive transparent nanocrystalline thin films,transparent nanocrystalline film,nanoporous materials,crystallinity,nanofabrication,wide band gap semiconductors,conducting materials,size 200 nm,nanorods,electrical conductivity,annealing,zinc oxide,grain size,ii-vi semiconductors,x-ray diffraction,rapid thermal plasma deposition,semiconductor growth,scanning electron micrography,transparency,scanning electron microscopy,amorphous substrates,chemical vapor deposition,nanoporosity,zinc compounds,plasma cvd,zno,rapid thermal processing,thermal plasma chemical vapor deposition,semiconductor thin films,grain orientation,orifices,thin film,heating,electric conductivity,scanning electron micrograph,palladium,x ray diffraction
Analytical chemistry,Rapid thermal processing,Annealing (metallurgy),Thin film,Crystallinity,Nanocrystalline material,Materials science,Carbon film,Amorphous solid,Chemical vapor deposition
Conference
ISBN
Citations 
PageRank 
978-1-4673-1122-9
0
0.34
References 
Authors
0
3
Name
Order
Citations
PageRank
Kwok Siong Teh101.01
Joachim Pedersen200.34
Heather Esposito300.34