Name
Title | ||
|---|---|---|
Two-Iris Method for the Electromagnetic Characterization of Conductor-Backed Absorbing Materials Using an Open-Ended Waveguide Probe. |
Abstract | ||
|---|---|---|
A two-iris waveguide-probe technique is introduced for measuring the electromagnetic properties of a lossy conductor-backed material layer. A flanged open-ended rectangular waveguide is applied to the material under test, and the reflected signal is measured under two conditions. The reflection is first measured when the aperture of the waveguide is unobstructed; then, the reflection is measured w... |
Year | DOI | Venue |
|---|---|---|
2012 | 10.1109/TIM.2011.2174111 | IEEE Transactions on Instrumentation and Measurement |
Keywords | Field | DocType |
Apertures,Materials,Iris,Electromagnetic waveguides,Permittivity measurement,Measurement uncertainty,Probes | Aperture,Permittivity,Waveguide (optics),Waveguide,Integral equation,Optics,Measurement uncertainty,Electronic engineering,Reflection coefficient,Mathematics,Instrumentation | Journal |
Volume | Issue | ISSN |
61 | 4 | 0018-9456 |
Citations | PageRank | References |
4 | 0.88 | 0 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Gary D. Dester | 1 | 4 | 0.88 |
| Edward J. Rothwell | 2 | 4 | 1.56 |
| Michael J. Havrilla | 3 | 4 | 2.24 |