Title
Reliability Considerations for Advanced Microelectronics
Year
DOI
Venue
2000
10.1109/PRDC.2000.897290
PRDC
Keywords
Field
DocType
advanced microelectronics,reliability considerations,reliability,microelectronics
Wireless,Computer science,Microelectronics,Customer needs,Fault tolerance,Electronic systems,Semiconductor industry,Reliability engineering,Power consumption
Conference
ISBN
Citations 
PageRank 
0-7695-0975-4
7
0.49
References 
Authors
0
1
Name
Order
Citations
PageRank
Sammy Kayali191.15