Name
Abstract | ||
|---|---|---|
•Attribute based descriptors of synaptic junctions in Electron Micrographs.•Proposed descriptors are low dimensional and scalable.•Investigation of feature fusion for detecting co-occurring attributes.•Large scale experiments on synapse classification/detection. |
Year | DOI | Venue |
|---|---|---|
2014 | 10.1016/j.patrec.2013.06.001 | Pattern Recognition Letters |
Keywords | Field | DocType |
Connectomics,Detection,Feature descriptors,Electron Micrographs | Object detection,Computer vision,Synapse,Connectomics,Pattern recognition,Computer science,Artificial intelligence,Scalability | Journal |
Volume | ISSN | Citations |
43 | 0167-8655 | 6 |
PageRank | References | Authors |
0.53 | 12 | 6 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Vignesh Jagadeesh | 1 | 217 | 12.74 |
| James R Anderson | 2 | 73 | 4.71 |
| Bryan Jones | 3 | 79 | 7.01 |
| Robert E Marc | 4 | 53 | 3.47 |
| Steven K Fisher | 5 | 11 | 1.89 |
| B. S. Manjunath | 6 | 7561 | 783.37 |