Title
Self-Testing of Universal and Fault-Tolerant Sets of Quantum Gates
Abstract
We consider the design of self-testers for quantum gates. A self-tester for the gates $\boldsymbol{F}_1,\ldots, \boldsymbol{F}_m$ is a procedure that, given any gates $\boldsymbol{G}_1, \ldots, \boldsymbol{G}_m$, decides with high probability if each $\boldsymbol{G}_i$ is close to $\boldsymbol{F}_i$. This decision has to rely only on measuring in the computational basis the effect of iterating the gates on the classical states. It turns out that, instead of individual gates, we can design only procedures for families of gates. To achieve our goal we borrow some elegant ideas of the theory of program testing: We characterize the gate families by specific properties, develop a theory of robustness for them, and show that they lead to self-testers. In particular we prove that the universal and fault-tolerant set of gates consisting of a Hadamard gate, a $\mathrm{c\text{-}NOT}$ gate, and a phase rotation gate of angle $\pi/4$ is self-testable.
Year
DOI
Venue
2007
10.1137/S0097539702404377
Clinical Orthopaedics and Related Research
Keywords
DocType
Volume
elegant idea,classical state,quantum gate,gate family,fault-tolerant sets,high probability,phase rotation gate,individual gate,hadamard gate,computational basis,quantum gates,program testing,fault tolerance,quantum circuit,fault tolerant,robustness
Journal
37
Issue
ISSN
ISBN
2
Proceedings of the 32nd Annual ACM Symposium on Theory of Computing (STOC2000), pages 688-696
1-58113-184-4
Citations 
PageRank 
References 
12
1.11
18
Authors
4
Name
Order
Citations
PageRank
Wim Van Dam136234.66
Frédéric Magniez257044.33
Michele Mosca3364.97
Miklos Santha472892.42