Abstract | ||
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Sequential algorithms of active learning based on the estimation of the level sets of the empirical risk are discussed in the paper. Localized Rademacher complexities are used in the algorithms to estimate the sample sizes needed to achieve the required accuracy of learning in an adaptive way. Probabilistic bounds on the number of active examples have been proved and several applications to binary classification problems are considered. |
Year | DOI | Venue |
---|---|---|
2010 | 10.5555/1756006.1953014 | Journal of Machine Learning Research |
Keywords | Field | DocType |
sample size,probabilistic bound,required accuracy,active example,localized rademacher complexity,rademacher complexities,empirical risk,level set,classification problem,sequential algorithm,excess risk,active learning,binary classification | Active learning,Binary classification,Pattern recognition,Active learning (machine learning),Rademacher complexity,Level set,Artificial intelligence,Probabilistic logic,Sample size determination,Mathematics,Machine learning,Bounding overwatch | Journal |
Volume | ISSN | Citations |
11, | 1532-4435 | 33 |
PageRank | References | Authors |
1.45 | 11 | 1 |
Name | Order | Citations | PageRank |
---|---|---|---|
Vladimir Koltchinskii | 1 | 89 | 9.61 |