Abstract | ||
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This paper handles the problem on reparability of key distribution protocols, whose concept was introduced by Hwang and Ku. Two reparable key distribution schemes, which were proposed by Hwang and Ku, are analyzed and their security defects are pointed out, which caused the discussion on whether there can be perfect reparability suitable fro implementation. Not agreeing with these authors about the result they got, this paper proposed an improved key distribution protocol, which removes security defects mentioned. Especially, a new method, concealing the repeat of event marker, is proposed. This method gives the protocol perfect reparability without making the protocol complex and does not increase computation much. |
Year | DOI | Venue |
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2000 | 10.1109/ICON.2000.875801 | ICON |
Keywords | Field | DocType |
security defect,improved key distribution,key distribution protocol,perfect reparability suitable fro,protocol perfect reparability,new method,reparable key distribution scheme,event marker,protocol complex,perfect reparability,improved key distribution protocol,cryptographic protocols,security,protocols,cryptography,network security,authentication,algorithm design and analysis,key distribution | Key distribution,Authentication,Algorithm design,Cryptographic protocol,Computer science,Computer security,Cryptography,Network security,Computer network,Telecommunication security,Computation | Conference |
ISBN | Citations | PageRank |
0-7695-0777-8 | 2 | 0.52 |
References | Authors | |
7 | 3 |
Name | Order | Citations | PageRank |
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hu li | 1 | 2 | 0.52 |
huanghai chen | 2 | 2 | 0.52 |
Hongwen Zhu | 3 | 144 | 15.68 |