Name
Abstract | ||
|---|---|---|
A RAM memory embedded in micro-controller was found affected by contact resistance degradation, induced by Read/Write operations, able to generate functional failures.. Failure mode, dedicated testing solution and reliability model, used to predict failure rate on fields, are discussed in this paper. Process weakness in contact receipt was finally found as root cause of the failure mode and fixed by process modification (C) 2002 Elsevier Science Ltd. All rights reserved. |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1016/S0026-2714(02)00150-6 | Microelectronics Reliability |
Keywords | Field | DocType |
contact resistance | Engineering physics,Instability,Electronic engineering,Static random-access memory,Engineering,Electrical resistivity and conductivity | Journal |
Volume | Issue | ISSN |
42 | 9 | 0026-2714 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| A. Mervic | 1 | 3 | 1.45 |
| A. Lanzani | 2 | 0 | 0.34 |
| M. Menchise | 3 | 1 | 0.71 |
| P. Serra | 4 | 0 | 0.34 |
| D. Gerosa | 5 | 0 | 0.34 |