Name
Abstract | ||
|---|---|---|
In this paper, we presents a programmable jitter generator. Different from the traditional jitter generator that uses the analog phase modulation (PM) technique to generate only non-Gaussian distributed jitter components, the proposed jitter generator uses digital techniques. It consists of a voltage controlled delay chain, jitter control block, and some basic digital components. It can generate not only the non-Gaussian distributed jitter component, but also the Gaussian-distributed jitter component. In addition, almost all jitter characteristics are controllable. This jitter generator can be used in jitter tolerance test and jitter transfer function measurement. A Xilinx XC4010 FPGA chip is used to validate this design. |
Year | DOI | Venue |
|---|---|---|
2004 | 10.1109/ETSYM.2004.1347578 | European Test Symposium |
Keywords | Field | DocType |
traditional jitter generator,jitter tolerance test,gaussian-distributed jitter component,jitter transfer function measurement,delay chain,jitter characteristic,programmable jitter generator,proposed jitter generator,jitter component,jitter generator,jitter control block,gaussian distribution,signal generators,chip,phase modulation,transfer function,signal analysis,field programmable gate arrays,system testing | Signal processing,Phase modulation,Computer science,Voltage,Signal generator,Field-programmable gate array,Real-time computing,Electronic engineering,Transfer function,Jitter,Automatic Generation Control | Conference |
ISBN | Citations | PageRank |
0-7695-2119-3 | 1 | 0.38 |
References | Authors | |
2 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Tian Xia | 1 | 72 | 12.41 |
| Peilin Song | 2 | 302 | 49.35 |
| Keith A. Jenkins | 3 | 56 | 7.98 |
| Jien-Chung Lo | 4 | 189 | 28.32 |