Paper Info
Title
A new approach for measuring the value of patents based on structural indicators for ego patent citation networks
Abstract
Technology sectors differ in terms of technological complexity. When studying technology and innovation through patent analysis it is well known that similar amounts of technological knowledge can produce different numbers of patented innovation as output. A new multilayered approach to measure the technological value of patents based on ego patent citation networks (PCNs) is developed in this study. The results show that the structural indicators for the ego PCN developed in this contribution can characterize groups of patents and, hence, in an indirect way, the health of companies. © 2012 Wiley Periodicals, Inc.
Year
DOI
Venue
2012
10.1002/asi.22632
JASIST
Keywords
Field
DocType
patented innovation,ego patent citation network,structural indicator,technology sector,technological value,wiley periodicals,different number,technological complexity,patent analysis,new approach,technological knowledge,ego pcn,scientometrics,knowledge management
Data mining,Computer science,Patent citation,Id, ego and super-ego,Scientometrics,Patent analysis
Journal
Volume
Issue
ISSN
63
9
1532-2882
Citations 
PageRank 
References 
9
0.66
11
Authors
3
Name
Order
Citations
PageRank
Xiaojun Hu111911.37
Ronald Rousseau260243.57
Jin Chen37916.66