Name
Abstract | ||
|---|---|---|
This paper presents dynamic two-stage fault isolation for sequential random logic very large scale integrated (VLSI) circuits, and introduces limited and dynamic fault dictionaries. In the first stage of the dynamic process, a limited fault dictionary identifies candidate faults, which are further distinguished in the second stage by a dictionary generated dynamically for the candidate faults and a subset of the test vectors. This provides high resolution but avoids the costs of full static dictionaries. Two-stage fault isolation is evaluated for benchmark circuits and on defects in industrial circuits. |
Year | DOI | Venue |
|---|---|---|
1998 | 10.1109/92.661261 | IEEE Trans. VLSI Syst. |
Keywords | Field | DocType |
dynamic fault dictionary,two-stage fault isolation,benchmark circuit,high resolution,full static dictionary,limited fault dictionary,dynamic process,dynamic two-stage fault isolation,industrial circuit,candidate fault,computational modeling,dictionaries,fault detection,vlsi circuits,sequential circuits,indexing terms,fault isolation,very large scale integration,vlsi | Stuck-at fault,Sequential logic,Fault coverage,Computer science,Fault detection and isolation,Real-time computing,Electronic engineering,Random logic,Very-large-scale integration,Fault model,Fault indicator | Journal |
Volume | Issue | ISSN |
6 | 1 | 1063-8210 |
Citations | PageRank | References |
11 | 0.68 | 9 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Paul G. Ryan | 1 | 170 | 15.29 |
| W. Kent Fuchs | 2 | 1469 | 279.02 |