Name
Abstract | ||
|---|---|---|
The aggressive scaling down of flash memories has threatened data reliability since the scaling down of cell sizes gives rise to more serious degradation mechanisms such as cell-to-cell interference and lateral charge spreading. The effect of these mechanisms has pattern dependency and some data patterns are more vulnerable than other ones. In this paper, we will categorize data patterns taking into account degradation mechanisms and pattern dependency. In addition, we propose several modulation coding schemes to improve the data reliability by transforming original vulnerable data patterns into more robust ones. |
Year | DOI | Venue |
|---|---|---|
2013 | 10.1109/ICCNC.2013.6504220 | ICNC '13 Proceedings of the 2013 International Conference on Computing, Networking and Communications (ICNC) |
Keywords | DocType | Volume |
cell size,serious degradation mechanism,data pattern,lateral charge,account degradation mechanism,cell-to-cell interference,flash memory,modulation coding,original vulnerable data pattern,pattern dependency,data reliability | Journal | abs/1304.4811 |
Citations | PageRank | References |
7 | 0.53 | 6 |
Authors | ||
7 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jun Jin Kong | 1 | 51 | 5.83 |
| Hongrak Son | 2 | 22 | 4.75 |
| Jaejin Lee | 3 | 1760 | 126.06 |
| Jaehong Kim | 4 | 383 | 41.59 |
| Kyoung Lae Cho | 5 | 7 | 0.87 |
| B. V. K. Vijaya Kumar | 6 | 7 | 0.87 |
| Yongjune Kim | 7 | 54 | 8.76 |