Name
Title | ||
|---|---|---|
How to Characterize the Problem of SEU in Processors and Representative Errors Observed on Flight |
Abstract | ||
|---|---|---|
In this paper are first summarized representative examples of anomalies observed in systems operating on-board satellites as the consequence of the effects of radiation on integrated circuit, showing that Single Event Upsets (SEU) are a major concern. An approach to predict the sensitivity to SEUs of a software application running on a processor-based architecture is then proposed. It is based on fault injection experiments allowing estimating the average rate of program dysfunctions per upset. This error rate, if combined with static cross-section figures obtained from radiation ground testing, provides an estimation of the target program error rate. The efficiency of this two-step approach was demonstrated by results obtained when applying it to various processors. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1109/IOLTS.2005.32 | international on line testing symposium |
Keywords | Field | DocType |
major concern,target program error rate,program dysfunctions,radiation ground testing,error rate,fault injection experiment,Single Event Upsets,two-step approach,integrated circuit,average rate | Space technology,Computer science,Word error rate,Electronic engineering,Real-time computing,Software,Upset,Electronic circuit,Integrated circuit,Single event upset,Fault injection | Conference |
ISBN | Citations | PageRank |
0-7695-2406-0 | 8 | 0.82 |
References | Authors | |
1 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Velazco, R. | 1 | 19 | 2.44 |
| R. Ecoffet | 2 | 20 | 3.24 |
| francois faure | 3 | 8 | 0.82 |