Name
Title | ||
|---|---|---|
A statistical approach to characterizing the reliability of systems utilizing HBT devices |
Abstract | ||
|---|---|---|
This paper describes a statistical approach to simulating the reliability of systems with HBT devices. Compared to the conventional worst-case method, the described approach utilizes statistical reliability information of the HBT individual devices, along with analysis on the critical paths of the system, to provide more accurate and more comprehensive reliability evaluation of the systems utilizing HBT devices. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1016/j.microrel.2005.01.014 | Microelectronics Reliability |
Keywords | DocType | Volume |
critical path,case method,critical path analysis,critical path method,statistical analysis,statistical tests,semiconductor devices,reliability,bipolar transistors,statistical distributions | Journal | 45 |
Issue | ISSN | Citations |
12 | 0026-2714 | 2 |
PageRank | References | Authors |
0.65 | 0 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yuan Chen | 1 | 2 | 0.65 |
| Qing Wang | 2 | 2 | 0.65 |
| Sammy Kayali | 3 | 9 | 1.15 |