Name
Abstract | ||
|---|---|---|
The number of expected errors due to manufacturing defaults as well as the soft-error-rate is increasing as electronic devices reach deep submicron scale. This requires adding fault tolerant techniques to improve the reliability of the circuit, thus making the task of the designer more complex. In this work, we propose a tool that helps the designer to select the most suitable implementation for a given target application, according to the design requirements. The proposed tool generates different (more reliable) versions of the original design based on Triple Modular Redundancy (TMR) technique and classifies them according to the metrics supplied by the designer. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1016/j.microrel.2010.07.095 | Microelectronics Reliability |
Keywords | Field | DocType |
fault tolerant | Soft error,Triple modular redundancy,Electronic engineering,Fault tolerance,Electronics,Engineering,Miniaturization,Electronic component,Reliability engineering,Modular architecture,Embedded system | Journal |
Volume | Issue | ISSN |
50 | 9 | 0026-2714 |
Citations | PageRank | References |
2 | 0.56 | 6 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| E. Crespo Marques | 1 | 2 | 0.56 |
| L. Alves de Barros Naviner | 2 | 2 | 0.56 |
| J. Naviner | 3 | 12 | 3.88 |