Title
Interconnects in the third dimension: design challenges for 3D ICs
Abstract
Despite generation upon generation of scaling, computer chips have until now remained essentially 2-dimensional. Improvements in on-chip wire delay and in the maximum number of I/O per chip have not been able to keep up with transistor performance growth; it has become steadily harder to hide the discrepancy. 3D chip technologies come in a number of flavors, but are expected to enable the extension of CMOS performance. Designing in three dimensions, however, forces the industry to look at formerly-two-dimensional integration issues quite differently, and requires the re-fitting of multiple existing EDA capabilities.
Year
DOI
Venue
2007
10.1145/1278480.1278623
Proceedings of the 50th Annual Design Automation Conference
Keywords
Field
DocType
chip,performance,assembly,3d chip,copper,microelectronics,cmos integrated circuits,3d,cmos technology,integrated circuit design,packaging,2 dimensional,bandwidth,theory,three dimensions,design,standardization,latency,interconnect
Computer science,CMOS,Chip,Electronic engineering,Integrated circuit design,Bandwidth (signal processing),Three-dimensional integrated circuit,Interconnection,Transistor,Electrical engineering,Wafer-scale integration
Conference
ISSN
Citations 
PageRank 
0738-100X
56
4.04
References 
Authors
12
11
Name
Order
Citations
PageRank
Kerry Bernstein1857.41
Paul Andry2564.04
Jerome Cann3564.04
Philip G. Emma422528.55
David Greenberg5564.04
Wilfried Haensch638936.68
Mike Ignatowski719211.60
Steve Koester8564.04
John Magerlein9817.51
Ruchir Puri1051571.90
Albert Young11584.51