Name
Abstract | ||
|---|---|---|
In this paper we develop and present an improved resistive circuit fault diagnosis method, a type of simulation after test (SAT), for the location of multiple faults in linear network. In this method we suggest a condition of branch fault diagnosis for locating multiple faults which is based on multiple excitation. Our diagnostic method based on this condition has the major advantage that it removes the necessity to verify the existence of multiple fault combinations. We demonstrate this method by applying it to a resistive network. |
Year | DOI | Venue |
|---|---|---|
1996 | 10.1002/(SICI)1097-007X(199607/08)24:4<467::AID-CTA927>3.0.CO;2-3 | INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS |
Field | DocType | Volume |
Stuck-at fault,Test method,Analogue electronics,Fault coverage,Control theory,Resistive touchscreen,Linear network,Algorithm,Electronic engineering,Linear circuit,Mathematics,Fault indicator | Journal | 24 |
Issue | ISSN | Citations |
4 | 0098-9886 | 2 |
PageRank | References | Authors |
2.55 | 0 | 2 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Dae Sik Kim | 1 | 2 | 3.22 |
| Poong-hyun Seong | 2 | 115 | 24.53 |