Abstract | ||
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High voltage generator is one of the critical subsystems of a medical system. So, a methodology assessing its reliability from component to system is proposed. In this context, N-channel power MOSFETs that are used in high frequency inverter for supplying high voltage transformer is tested. These MOSFETs are subjected to power cycling test in order to reveal thermo-mechanical failure modes and at the same time evaluate their lifetime using DoE. The test is done by using an external current supply to induce self-heating through the component. Heating and cooling phase are controlled by a logic controller. The ON state resistance (R-DSON) is monitored during the test as the failure indicator and different imaging methods are used for failure analysis and observed failures mechanism are discussed. (C) 2013 Elsevier Ltd. All rights reserved. |
Year | DOI | Venue |
---|---|---|
2013 | 10.1016/j.microrel.2013.07.096 | MICROELECTRONICS RELIABILITY |
Field | DocType | Volume |
Inverter,Control theory,Power MOSFET,Cycling,AC power,Electronic engineering,High voltage transformer,Engineering,Power cycling,High voltage,Electrical engineering,Reliability engineering | Journal | 53 |
Issue | ISSN | Citations |
SP9-11 | 0026-2714 | 3 |
PageRank | References | Authors |
0.50 | 6 | 5 |
Name | Order | Citations | PageRank |
---|---|---|---|
Amadou Sow | 1 | 3 | 0.50 |
Sinivassane Somaya | 2 | 3 | 0.50 |
Yves Ousten | 3 | 6 | 2.59 |
Jean-Michel Vinassa | 4 | 67 | 13.53 |
Fanny Patoureaux | 5 | 3 | 0.50 |