Name
Year | DOI | Venue |
|---|---|---|
1992 | 10.1109/TEST.1992.527841 | ITC |
Keywords | Field | DocType |
delay testing,4800-pin board tester,very large scale integration,system testing,packaging | System testing,Computer science,Real-time computing,Electronic engineering,Interconnection,Very-large-scale integration,Embedded system | Conference |
ISBN | Citations | PageRank |
0-7803-0760-7 | 0 | 0.34 |
References | Authors | |
2 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Shuichi Kameyama | 1 | 0 | 1.01 |
| Hideyuki Ohara | 2 | 2 | 1.33 |
| Chihiro Endo | 3 | 0 | 0.34 |
| Naoki Takayama | 4 | 70 | 8.16 |