Paper Info
Title
Automatic Experimental Analysis of Communication Patterns in Virtual Topologies
Abstract
Automatic pattern search in event traces is a powerful method to identify performance problems in parallel applications. We demonstrate that knowledge about the virtual topology, which defines logical adjacency relationships between processes, can be exploited to explain the occurrence of inefficiency patterns in terms of the parallelization strategy used in an application. We show correlations between higher-level events related to a parallel wavefront scheme and wait states identified by our pattern analysis. In addition, we visually expose relationships between pattern occurrences and the topological characteristics of the affected processes.
Year
DOI
Venue
2005
10.1109/ICPP.2005.21
ICPP
Keywords
DocType
ISSN
affected process,event trace,logical adjacency relationship,parallel wavefront scheme,Communication Patterns,higher-level event,parallel application,Automatic Experimental Analysis,inefficiency pattern,Virtual Topologies,pattern occurrence,pattern analysis,automatic pattern search
Conference
0190-3918
ISBN
Citations 
PageRank 
0-7695-2380-3
1
0.35
References 
Authors
0
4
Name
Order
Citations
PageRank
Fengguang Song123219.88
Felix Wolf21264107.97
Jack J. Dongarra3176252615.79
Bernd Mohr414717.80