Name
Title | ||
|---|---|---|
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters |
Abstract | ||
|---|---|---|
Most scan based designs implement the scan enable as a slow speed global control signal, and can therefore only implement launch-on-capture (LOC) delay tests. Launch-onshift (LOS) tests are generally more effective, achieving higher fault coverage with ... |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/ETS.2006.37 | European Test Symposium |
Keywords | Field | DocType |
mixed-signal performance parameters,global control signal,delay test,optimized signature-based statistical alternate,higher fault coverage,slow speed,hardware,prediction error,design for testability,accuracy | Design for testing,Mean squared prediction error,Nonlinear system,Expression (mathematics),Computer science,Automatic testing,Electronic engineering,Design under test,Mixed-signal integrated circuit,Built-in self-test | Conference |
ISSN | ISBN | Citations |
1530-1877 | 0-7695-2566-0 | 5 |
PageRank | References | Authors |
0.47 | 7 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Byoungho Kim | 1 | 113 | 14.39 |
| Hongjoong Shin | 2 | 52 | 5.27 |
| Ji Hwan (Paul) Chun | 3 | 16 | 2.39 |
| J. Abraham | 4 | 4905 | 608.16 |