Title
Control of wafer release in multi cluster tools.
Year
DOI
Venue
2010
10.1109/ICCA.2010.5524415
ICCA
Keywords
Field
DocType
photolithography,steady state,mathematical model,automatic control,clustering algorithms,robots,lithography,optimization,heuristic algorithm,job shop scheduling,throughput,robot control,semiconductor device modeling,residence time
Wafer,Robot control,Heuristic,Job shop scheduling,Semiconductor device modeling,Transient state,Automatic control,Control engineering,Engineering,Throughput
Conference
Citations 
PageRank 
References 
2
0.37
5
Authors
2
Name
Order
Citations
PageRank
Kyungsu Park161.81
James R. Morrison219526.43